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| AD7225TQ | -0.3, +17V; 500mW; LC2MOS quad 8-bit DAC with separate reference inputs | Analog Devices | CERDIP | 24 | -40°C | 85°C | AD7225TQ datasheet (309K) |
| AD7225UE | -0.3, +17V; 500mW; LC2MOS quad 8-bit DAC with separate reference inputs | Analog Devices | LCC | 28 | -55°C | 125°C | AD7225UE datasheet (309K) |
| AD7225UQ | -0.3, +17V; 500mW; LC2MOS quad 8-bit DAC with separate reference inputs | Analog Devices | CERDIP | 24 | -40°C | 85°C | AD7225UQ datasheet (309K) |
| AD7226 | CMOS, Quad 8-Bit Voltage Output DAC | Analog Devices | N/A | - | N/A | N/A | AD7226 datasheet (247K) |
| AD7226BQ | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | CERDIP | 20 | -40°C | 85°C | AD7226BQ datasheet (247K) |
| AD7226KN | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | DIP | 20 | -40°C | 85°C | AD7226KN datasheet (247K) |
| AD7226KP | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | PLCC | 20 | -40°C | 85°C | AD7226KP datasheet (247K) |
| AD7226KR | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | SOIC | 20 | -40°C | 85°C | AD7226KR datasheet (247K) |
| AD7226TE | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | LCC | 20 | -55°C | 125°C | AD7226TE datasheet (247K) |
| AD7226TQ | -0.3, +17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters | Analog Devices | CERDIP | 20 | -55°C | 125°C | AD7226TQ datasheet (247K) |