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National Instruments Expands High-Speed Digitizer Product Line

With 10X Higher Measurement Throughput, New Digitizers Offer High-Speed Measurement Capability Optimized for Automated Test

National Instruments today announced the expansion of its digitizer product line with the introduction of three new digitizers/PC-based oscilloscopes. The 500 MHz NI PXI-5153 and NI PCI-5153 and the 1 GHz NI PCI-5154 modules round out the NI 515x series of digitizers, following the introduction of the NI PXI-5154 in July. With the NI 515x series, engineers can take advantage of a complete line of high-speed digitizers – with 300 MHz, 500 MHz and 1 GHz bandwidths – for demanding automated test and streaming applications where high-bandwidth measurements are required.


All three new products feature up to 256 MB of deep onboard memory per channel, providing accurate measurements by sustaining up to 2 GS/s real-time sampling rates over extended data capture windows. Engineers can use these digitizers to address a wide range of measurement needs in the consumer electronics, semiconductor, aerospace and defense and life sciences industries.

“High-bandwidth measurements are a complicated and expensive part of any automated test system,” said Ray Morgan, senior product engineer at ON Semiconductor. “With the 1 GHz PXI-5154 digitizer and the 2.7 GHz PXI-2547 8x1 high-frequency multiplexer, we created a low-cost 16-channel oscilloscope. The 1 GHz digitizer in the modular format has helped us test our new high-bandwidth products at a fraction of our previous test times.”

NI 515x digitizers are the first high-bandwidth digitizers on the market with three characteristics that make them optimized for automated test – tight synchronization between channels, ease of integration with other instrumentation and high data throughput. Using T-Clock technology, which synchronizes multiple instruments and was patented by National Instruments, engineers can integrate NI 515x digitizers with a variety of NI hardware, including arbitrary waveform generators and digital waveform generator/analyzers, to customize and build a complete, automated mixed-signal test system. Engineers also can synchronize multiple digitizers to build systems with up to 34 channels in a single PXI chassis, all simultaneously sampling at 1 GS/s and synchronized to picosecond-level accuracy between modules.

The PXI platform, upon which NI high-speed digitizers are built, provides measurement throughput up to 10 times faster than alternative instrument architectures because of the high-bandwidth and low-latency PCI bus. The digitizers’ high bandwidth, fast data throughput and tight multi-module synchronization are particularly beneficial for applications including mass spectrometry, radar, signal intelligence, non-destructive test and high-channel-count physics experimentation.

Engineers can combine the new digitizers with NI LabVIEW SignalExpress interactive measurement software to quickly acquire data, perform measurements and view and analyze data in Microsoft Excel or NI DIAdem test management software. Additionally, the NI 515x digitizers work with all National Instruments software including the NI LabVIEW graphical system design platform and the NI LabWindows™/CVI ANSI C development environment as well as other development environments such as ANSI C, Microsoft C++ and Visual Basic.

For more information on the new digitizers, readers may visit www.ni.com/digitizers/highspeed.

From: http://digital.ni.com


Publication date: 28.10.2008


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