Tektronix Opens U.S. Serial Testing Technology Center
Tektronix, Inc., a leading, worldwide provider of test, measurement and monitoring instrumentation, announced the opening of a serial test and measurement center in Santa Clara, California
Design engineers developing new high speed serial technologies such as Serial ATA Revision 3.0, PCI Express 2.0 and PCI Express 3.0, SuperSpeed USB, HDMI CTS1.3, and DisplayPort 1.1a, need to process large amounts of data with greater signaling complexities. Testing new devices employing these technologies requires sophisticated testing that includes advanced hardware, application software, probes and other test accessories. The Santa Clara Technology Center highlights advanced technologies and provides customers a firsthand experience of how Tektronix applications can work for them to improve their design efficiency.
“The challenge of making PHY layer measurements for high-speed serial data technologies is becoming more complex,” said Martyn Etherington, vice president of worldwide marketing, Tektronix. “With increasing go-to-market pressures that engineers face, our customers need a place to go where they can get expert guidance on test setup, testing procedures, and execution; that’s why we’ve opened the Santa Clara Technology Center.”
The Santa Clara facility will also be used to conduct group training events to further assist engineers with their high-speed serial data designs. To learn more about the Santa Clara Technology Center or to schedule a visit, contact your local Tektronix account manager.
From: http://www2.tek.com
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